• Product pinout
  • Description
  • SN74ABT18245A,Scan Test Devices With 18-Bit Bus Transceivers
  • The ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
  • SN74ABT8245,Scan Test Devices With Octal Bus Transceivers
  • The ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
  • SCANSTA101,Low Voltage IEEE 1149.1 STA Master
  • The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer (uP, RAM/ROM, clock, etc.), SCANEASE r2.0 software, and a STA101.
    The SCANSTA101 is an enhanced version ...
  • SCANSTA112,7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer
  • The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test ...
  • SCANSTA476,Eight Input IEEE 1149.1 Analog Voltage Monitor
  • The SCANSTA476 is a low power, Analog Voltage Monitor used for sampling or monitoring up to 8 analog/mixed-signal input channels. Analog Voltage Monitors are valuable during product development, environmental test, production, and field service ...