The ?LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other ...
The LVT8986 linking addressable scan ports (LASPs) are members of the TI family of IEEE Std 1149.1 (JTAG) scan-support products. The scan-support product family facilitates testing of fully boundary-scannable devices. The LASP applies linking shadow protocols ...
The ABT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments (TITM) SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit ...
The \'ACT8990 test-bus controllers (TBC) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board ...
The \'ACT8997 are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies. The \'ACT8997 enhance the scan capability of TI\'s SCOPETM family by ...
The ?LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other ...
The LVT8986 linking addressable scan ports (LASPs) are members of the TI family of IEEE Std 1149.1 (JTAG) scan-support products. The scan-support product family facilitates testing of fully boundary-scannable devices. The LASP applies linking shadow protocols ...
The LVT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike ...
The ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
The SN74ABT18502 scan test device with an 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE? testability IC family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board ...
The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of ...
The ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE? testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access ...
This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE? testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access ...
The ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
The ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
The ABT8646 and scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE? testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of ...
The ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of ...
The ABT8952 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
The ABTH18502A and ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate ...
The ABTH18504A and ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate ...
The ABTH18646A and ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to ...
The ABTH18652A and ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to ...
The ABTH18502A and ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate ...
The ABTH18504A and ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate ...
The ABTH18646A and ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to ...
The ABTH18652A and ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to ...
The BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board ...
The BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board ...
The BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ...
The BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit ...
The BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of ...
The LVT18512 and LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing ...
The LVTH18502A and LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE? testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate ...
The \'LVTH18504A and LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate ...
The LVTH18512 and LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing ...
The LVTH18646A and LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to ...
The LVTH18652A and LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to ...
The LVTH18502A and LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE? testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate ...
The LVTH18504A and LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate ...
The SN74LVTH18511 is an 18-bit universal bus transceiver with boundary scan. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire ...
The \'LVTH18512 and \'LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate ...
The \'LVTH18646A and \'LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to ...
The \'LVTH18652A and \'LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to ...
The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create
a tester are a microcomputer (uP, RAM/ROM, clock, etc.), SCANEASE r2.0 software, and a STA101. The SCANSTA101 is an enhanced version ...
The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test ...
The SCANSTA112 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test ...
The SCANSTA476 is a low power, Analog Voltage Monitor
used for sampling or monitoring up to 8 analog/mixed-signal
input channels.
Analog Voltage Monitors are valuable during product
development, environmental test, production, and field service ...
The SCAN921023 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921224 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus ...
The SCAN921025 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus ...
The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data ...
The SCAN921023 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921224 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus ...
The SCAN921025 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus ...
The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data ...
The SCAN921260 integrates six deserializer devices into a single chip. The SCAN921260 can simultaneously deserialize up to six data streams that have been serialized by the National Semiconductor SCAN921023 Bus LVDS serializer. The device also includes a ...
The SCAN921821 is a dual channel 18-bit serializer featuring signal conditioning, boundary SCAN, and at-speed BIST. Each serializer block transforms an 18-bit parallel LVCMOS/LVTTL data bus into a single Bus LVDS data stream with embedded clock. This single ...
The SCAN926260 integrates six 10-bit deserializer devices into a single chip. The SCAN926260 can simultaneously deserialize up to six data streams that have been serialized by National Semiconductor\'s 10-bit Bus LVDS serializers. In addition, the SCAN926260 ...
The SCAN928028 integrates eight serializer devices into a single chip. The SCAN928028 can simultaneously serialize up to eight 10-bit data streams. The 10-bit parallel inputs are LVTTL signal levels. The serialized outputs are LVDS signals with extra drive ...
