1Gb D-die DDR3 SDRAM SpecificationThe 1Gb DDR3 SDRAM D-die( K4B1G0446D K4B1G0846D K4B1G1646D ) is organized as a 32Mbit x 4 I/Os x 8banks,
16Mbit x 8 I/Os x 8banks or 8Mbit x 16 I/Os x 8 banks device. This syn-
chronous device achieves high speed double-data-rate transfer rates of up
to 1600Mb/sec/pin (DDR3-1600) for general applications.
The chip is designed to comply with the following key DDR3 SDRAM fea-
tures such as posted CAS, Programmable CWL, Internal (Self) Calibra-
tion, On Die Termination using ODT pin and Asynchronous Reset .
All of the control and address inputs are synchronized with a pair of exter-
nally supplied differential Clocks Inputs are latched at the crosspoint of dif-
ferential Clocks (CK rising and CK falling). All I/Os are synchronized with a
pair of bidirectional strobes (DQS and DQS) in a source synchronous fash-
ion. The address bus is used to convey row, column, and bank address
information in a RAS/CAS multiplexing style. The DDR3 device operates
with a single 1.5V 0.075V powersupply and 1.5V 0.075V VDDQ.
The 1Gb DDR3 D-die device is available in 82ball FBGAs(x4/x8) and
100ball FBGA(x16) By Samsung Semiconductor, Inc.
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