1Gb E-die DDR3 SDRAM SpecificationThe 1Gb DDR3 SDRAM E-die is organized as a 32Mbit x 4 I/Os x 8banks,
16Mbit x 8 I/Os x 8banks or 8Mbit x 16 I/Os x 8 banks device. This syn-
chronous device achieves high speed double-data-rate transfer rates of up
to 1600Mb/sec/pin (DDR3-1600) for general applications.
The chip is designed to comply with the following key DDR3 SDRAM fea-
tures such as posted CAS, Programmable CWL, Internal (Self) Calibra-
tion, On Die Termination using ODT pin and Asynchronous Reset .
All of the control and address inputs are synchronized with a pair of exter-
nally supplied differential Clocks Inputs are latched at the crosspoint of dif-
ferential Clocks (CK rising and CK falling). All I/Os are synchronized with a
pair of bidirectional strobes (DQS and DQS) in a source synchronous fash-
ion. The address bus is used to convey row, column, and bank address
information in a RAS/CAS multiplexing style. The DDR3 device operates
with a single 1.5V ± 0.075V power supply and 1.5V ± 0.075V VDDQ.
The 1Gb DDR3 E-die device is available in 78ball FBGAs(x4/x8) and
96ball FBGA(x16) By Samsung Semiconductor, Inc.
|
|

| K4B1G0446E Pb-Free | K4B1G0446E Cross Reference | K4B1G0446E Schematic | K4B1G0446E Distributor |
| K4B1G0446E Application Notes | K4B1G0446E RoHS | K4B1G0446E Circuits | K4B1G0446E footprint |
