COMMON MODE EMI SUPPRESSION INDUCTORS |
Part | Manufacturer | Description | Datasheet | Samples | |
---|---|---|---|---|---|
5962-9172601MLA | Texas Instruments | Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 | |||
5962-9172801QLA | Texas Instruments | Scan Test Devices With Octal Bus Transceivers 24-CDIP -55 to 125 | |||
5962-9175301M2A | Texas Instruments | Octal Buffers/Drivers With 3-State Outputs 20-LCCC -55 to 125 | |||
5962-9172501M3A | Texas Instruments | Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125 | |||
5962-9172501MLA | Texas Instruments | Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125 | |||
5962-9172601M3A | Texas Instruments | Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 | |||
5962-9172701Q3A | Texas Instruments | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 | |||
5962-9172801Q3A | Texas Instruments | Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125 | |||
5962-9172701QLA | Texas Instruments | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 | |||
5962-9174601Q3A | Texas Instruments | Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 |
|
PE-62917 Pb-Free | PE-62917 Cross Reference | PE-62917 Schematic | PE-62917 Distributor |
PE-62917 Application Notes | PE-62917 RoHS | PE-62917 Circuits | PE-62917 footprint |