Transparent Latch With 25ohm Series Resistor Outputs

The SCAN182373A is a high performance BiCMOS trans- parent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture with the incorporation of the defined boundary- scan test Logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). By Fairchild Semiconductor
SCAN182373A 's PackagesSCAN182373A 's pdf datasheet

SCAN182373A Pinout, Pinouts
SCAN182373A pinout,Pin out
This is one package pinout of SCAN182373A,If you need more pinouts please download SCAN182373A's pdf datasheet.

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