Transparent Latch With 25ohm Series Resistor OutputsThe SCAN182373A is a high performance BiCMOS trans-
parent latch featuring separate data inputs organized into
dual 9-bit bytes with byte-oriented latch enable and output
enable control signals. This device is compliant with IEEE
1149.1 Standard Test Access Port and Boundary-Scan
Architecture with the incorporation of the defined boundary-
scan test Logic and test access port consisting of Test Data
Input (TDI), Test Data Out (TDO), Test Mode Select (TMS),
and Test Clock (TCK). By Fairchild Semiconductor
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| SCAN182373A Pb-Free | SCAN182373A Cross Reference | SCAN182373A Schematic | SCAN182373A Distributor |
| SCAN182373A Application Notes | SCAN182373A RoHS | SCAN182373A Circuits | SCAN182373A footprint |
