Six 1 To 10 Bus LVDS Deserializers With IEEE 1149.1 And At-Speed BIST

The SCAN926260 integrates six 10-bit deserializer devices into a single chip. The SCAN926260 CAN simultaneously deserialize up to six data streams that have been serialized by National Semiconductor's 10-bit Bus LVDs serializers. In addition, the SCAN926260 is compliant with IEEE standard 1149.1 and also features an At-Speed Built-In Self Test (BIST). For more details, please see the sections titled "IEEE 1149.1 Test Modes" and "BIST Alone Test Modes."
Each deserializer block in the SCAN926260 has it's own powerdown pin (PWRDWN[n]#)and operates independently with its own Clock recovery circuitry and lock-detect signaling. In addition, a master powerdown pin (MS_PWRDWN#) which puts all the entire device into sleep mode is provided.
The SCAN926260 uses a single +3.3V power supply and consumes 1.2W at 3.3V with a PRBS-15 pattern on all channels at 660Mbps.
By National Semiconductor Corporation
Part Manufacturer Description Datasheet Samples
SCAN926260TUFX/NOPB Texas Instruments Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85
SCAN926260TUF Texas Instruments Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85
SCAN926260TUFX Texas Instruments Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85
SCAN926260TUF/NOPB Texas Instruments Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85
SCAN926260 's PackagesSCAN926260 's pdf datasheet
SCAN926260TUF LBGA
SCAN926260TUFX LBGA

SCAN926260 pdf datasheet download


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