Six 1 To 10 Bus LVDS Deserializers With IEEE 1149.1 And At-Speed BIST
The SCAN926260 integrates six 10-bit deserializer devices into a single chip. The SCAN926260 CAN simultaneously deserialize up to six data streams that have been serialized by National Semiconductor's 10-bit Bus LVDs serializers. In addition, the SCAN926260 is compliant with IEEE standard 1149.1 and also features an At-Speed Built-In Self Test (BIST). For more details, please see the sections titled "IEEE 1149.1 Test Modes" and "BIST Alone Test Modes."
Each deserializer block in the SCAN926260 has it's own powerdown pin (PWRDWN[n]#)and operates independently with its own Clock recovery circuitry and lock-detect signaling. In addition, a master powerdown pin (MS_PWRDWN#) which puts all the entire device into sleep mode is provided.
The SCAN926260 uses a single +3.3V power supply and consumes 1.2W at 3.3V with a PRBS-15 pattern on all channels at 660Mbps.
By National Semiconductor Corporation
|SCAN926260TUF||Texas Instruments||HEX LINE RECEIVER, PBGA196, LBGA-196|
|SCAN926260TUFX||Texas Instruments||HEX LINE RECEIVER, PBGA196, LBGA-196|
|SCAN926260TUFX/NOPB||Texas Instruments||LINE RECEIVER|
|SCAN926260TUF/NOPB||Texas Instruments||HEX LINE RECEIVER, PBGA196, LBGA-196|
|SCAN926260 Pb-Free||SCAN926260 Cross Reference||SCAN926260 Schematic||SCAN926260 Distributor|
|SCAN926260 Application Notes||SCAN926260 RoHS||SCAN926260 Circuits||SCAN926260 footprint|