The ABT18640 scan test devices with 18-bit inverting Bus Transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface In the normal mode, these devices are 18-bit inverting Bus Transceivers They CAN be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE Bus Transceivers Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the Logic level at DIR. OE CAN be used to disable the device so that the buses are effectively isolated. In the test mode, the normal operation of the SCOPE Bus Transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990 By Texas Instruments
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SN54ABT18640 Pinout, Pinouts
SN54ABT18640 pinout,Pin out
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