SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERSThe ABT8646 and scan-test devices with octal
Bus Transceivers and Registers are members of the
Texas Instruments SCOPE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) Interface
In the normal mode, these devices are functionally equivalent to the F646 and ABT646 octal Bus Transceivers
and Registers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal Bus Transceivers and Registers By Texas Instruments
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SN54ABT8646 Pb-Free | SN54ABT8646 Cross Reference | SN54ABT8646 Schematic | SN54ABT8646 Distributor |
SN54ABT8646 Application Notes | SN54ABT8646 RoHS | SN54ABT8646 Circuits | SN54ABT8646 footprint |