SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERSThe ABT8652 scan test devices with octal bus
transceivers and Registers are members of the
Texas Instruments SCOPE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) Interface
In the normal mode, these devices are functionally equivalent to the F652 and ABT652 octal Bus Transceivers
and Registers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal Bus Transceivers and Registers By Texas Instruments
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SN54ABT8652 Pb-Free | SN54ABT8652 Cross Reference | SN54ABT8652 Schematic | SN54ABT8652 Distributor |
SN54ABT8652 Application Notes | SN54ABT8652 RoHS | SN54ABT8652 Circuits | SN54ABT8652 footprint |