SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERSThe ABT8952 scan test devices with octal
registered Bus Transceivers are members of the
Texas Instruments SCOPE testability integra-
ted-circuit family. This family of devices supports
IEEE Standard 1149.1-1990 boundary scan to
facilitate testing of complex circuit-board assem-
blies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) Interface
In the normal mode, these devices are functionally equivalent to the BCT2952 and ABT2952 octal registered
Bus Transceivers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal registered Bus Transceivers By Texas Instruments
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SN54ABT8952 Pb-Free | SN54ABT8952 Cross Reference | SN54ABT8952 Schematic | SN54ABT8952 Distributor |
SN54ABT8952 Application Notes | SN54ABT8952 RoHS | SN54ABT8952 Circuits | SN54ABT8952 footprint |