SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERSThe BCT8240A scan test devices SN54BCT8240A SN74BCT8240A with octal
Buffers are members of the Texas Instruments
SCOPE testability integrated-circuit family. This
family of devices supports IEEE Standard
1149.1-1990 boundary scan to facilitate testing of
complex circuit-board assemblies. Scan access
to the test circuitry is accomplished via the 4-wire
test access port (TAP) Interface
In the normal mode, these devices are functionally equivalent to the F240 and BCT240 octal Buffers The test
circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device terminals
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE octal Buffers
In the test mode, the normal operation of the SCOPE octal Buffers is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform
boundary-scan test operations, as described in IEEE Standard 1149.1-1990 By Texas Instruments
|
|
SN54BCT8240A Pb-Free | SN54BCT8240A Cross Reference | SN54BCT8240A Schematic | SN54BCT8240A Distributor |
SN54BCT8240A Application Notes | SN54BCT8240A RoHS | SN54BCT8240A Circuits | SN54BCT8240A footprint |