SCAN TEST DEVICES WITH OCTAL BUFFERS

The BCT8244A scan test devices SN54BCT8244A SN74BCT8244A with octal Buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface In the normal mode, these devices are functionally equivalent to the F244 and BCT244 octal Buffers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE octal Buffers In the test mode, the normal operation of the SCOPE octal Buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990 By Texas Instruments
SN54BCT8244A 's PackagesSN54BCT8244A 's pdf datasheet
SNJ54BCT8244AFK LCCC
SNJ54BCT8244AJT DIP




SN54BCT8244A Pinout, Pinouts
SN54BCT8244A pinout,Pin out
This is one package pinout of SN54BCT8244A,If you need more pinouts please download SN54BCT8244A's pdf datasheet.

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