The BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface In the normal mode, these devices are functionally equivalent to the F245 and BCT245 octal Bus Transceivers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE octal Bus Transceivers In the test mode, the normal operation of the SCOPE octal Bus Transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform boundary-scan test operations as described in IEEE Standard 1149.1-1990. By Texas Instruments
SN54BCT8245A 's PackagesSN54BCT8245A 's pdf datasheet

SN54BCT8245A Pinout, Pinouts
SN54BCT8245A pinout,Pin out
This is one package pinout of SN54BCT8245A,If you need more pinouts please download SN54BCT8245A's pdf datasheet.

SN54BCT8245A circuits will be updated soon..., now you can download the pdf datasheet to check the circuits!

Related Electronics Part Number

Related Keywords:

SN54BCT8245A Pb-Free SN54BCT8245A Cross Reference SN54BCT8245A Schematic SN54BCT8245A Distributor
SN54BCT8245A Application Notes SN54BCT8245A RoHS SN54BCT8245A Circuits SN54BCT8245A footprint