SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

The BCT8373A scan test devices with octal D-type Latches SN54BCT8373A SN74BCT8373A are members of the Texas Instruments SCOPE testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface In the normal mode, these devices are functionally equivalent to the F373 and BCT373 octal D-type Latches The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE octal Latches In the test mode, the normal operation of the SCOPE octal Latches is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform boundary scan test operations, as described in IEEE Standard 1149.1-1990. By Texas Instruments
SN54BCT8373A 's PackagesSN54BCT8373A 's pdf datasheet
SNJ54BCT8373AFK LCCC
SNJ54BCT8373AJT DIP




SN54BCT8373A Pinout, Pinouts
SN54BCT8373A pinout,Pin out
This is one package pinout of SN54BCT8373A,If you need more pinouts please download SN54BCT8373A's pdf datasheet.

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