SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

The BCT8374A scan test devices SN54BCT8374A SN74BCT8374A with octal edge-triggered D-type Flip-Flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface In the normal mode, these devices are functionally equivalent to the F374 and BCT374 octal D-type Flip-Flops The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE octal Flip-Flops In the test mode, the normal operation of the SCOPE octal Flip-Flops is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform boundary-scan test operations as described in IEEE Standard 1149.1-1990. By Texas Instruments
Part Manufacturer Description Datasheet Samples
SNJ54BCT8374AFK Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
SNJ54BCT8374AJT Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
5962-9172701QLA Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
5962-9172701Q3A Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
SN54BCT8374A 's PackagesSN54BCT8374A 's pdf datasheet
SNJ54BCT8374AFK LCCC
SNJ54BCT8374AJT DIP




SN54BCT8374A Pinout, Pinouts
SN54BCT8374A pinout,Pin out
This is one package pinout of SN54BCT8374A,If you need more pinouts please download SN54BCT8374A's pdf datasheet.

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