3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERSThe LVTH18512 and LVTH182512 scan test devices with 18-bit universal Bus Transceivers SN54LVTH18512 SN54LVTH182512 SN74LVTH18512 SN74LVTH182512 are members of
the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Std
1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test
circuitry is accomplished via the 4-wire test access port (TAP) Interface
Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the
capability to provide a TTL Interface to a 5-V system environment By Texas Instruments
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| SN54LVTH182512 Pb-Free | SN54LVTH182512 Cross Reference | SN54LVTH182512 Schematic | SN54LVTH182512 Distributor |
| SN54LVTH182512 Application Notes | SN54LVTH182512 RoHS | SN54LVTH182512 Circuits | SN54LVTH182512 footprint |
