3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

The LVTH18512 and LVTH182512 scan test devices with 18-bit universal Bus Transceivers SN54LVTH18512 SN54LVTH182512 SN74LVTH18512 SN74LVTH182512 are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL Interface to a 5-V system environment By Texas Instruments
SN54LVTH182512 's PackagesSN54LVTH182512 's pdf datasheet
SN54LVTH18512




SN54LVTH182512 Pinout, Pinouts
SN54LVTH182512 pinout,Pin out
This is one package pinout of SN54LVTH182512,If you need more pinouts please download SN54LVTH182512's pdf datasheet.

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