Scan Test Devices With Octal Bus Transceivers And Registers

The ABT8646 and scan test devices with octal Bus Transceivers and Registers are members of the Texas Instruments SCOPE? testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface In the normal mode, these devices are functionally equivalent to the ?F646 and ?ABT646 octal Bus Transceivers and Registers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE? octal Bus Transceivers and Registers Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.
Data flow is controlled by Clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated Registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that CAN be performed with the ?ABT8646.
In the test mode, the normal operation of the SCOPE? Bus Transceivers and Registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test Clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP Interface
The SN54ABT8646 is characterized for operation over the full military temperature range of ?55C to 125C. The SN74ABT8646 is characterized for operation from ?40C to 85C.
By Texas Instruments
Part Manufacturer Description Datasheet Samples
SN74ABT8646DWR Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SOIC-28, Bus Driver/Transceiver
SN74ABT8646DWE4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SOIC -40 to 85
SN74ABT8646DWG4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SOIC -40 to 85
SN74ABT8646DLRG4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SSOP -40 to 85
SN74ABT8646DWRE4 Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SOIC-28, Bus Driver/Transceiver
SN74ABT8646DWRG4 Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SOIC-28, Bus Driver/Transceiver
SN74ABT8646DLR Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SSOP -40 to 85
SN74ABT8646DLG4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SSOP -40 to 85
SN74ABT8646DW Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SOIC -40 to 85
SN74ABT8646DL Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SSOP -40 to 85
SN74ABT8646 's PackagesSN74ABT8646 's pdf datasheet
SN74ABT8646DL SSOP
SN74ABT8646DLG4 SSOP
SN74ABT8646DLR SSOP
SN74ABT8646DLRG4 SSOP
SN74ABT8646DW SOIC
SN74ABT8646DWE4 SOIC
SN74ABT8646DWG4 SOIC
SN74ABT8646DWR SOIC
SN74ABT8646DWRE4 SOIC
SN74ABT8646DWRG4 SOIC

SN74ABT8646 pdf datasheet download


SN74ABT8646 Pinout, Pinouts
SN74ABT8646 pinout,Pin out
This is one package pinout of SN74ABT8646,If you need more pinouts please download SN74ABT8646's pdf datasheet.

SN74ABT8646 circuits will be updated soon..., now you can download the pdf datasheet to check the circuits!

Related Electronics Part Number

Related Keywords:

SN74ABT8646 Pb-Free SN74ABT8646 Cross Reference SN74ABT8646 Schematic SN74ABT8646 Distributor
SN74ABT8646 Application Notes SN74ABT8646 RoHS SN74ABT8646 Circuits SN74ABT8646 footprint
Hot categories