Scan Test Devices With Octal Bus Transceivers And Registers

The ABT8652 scan test devices with octal Bus Transceivers and Registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface
In the normal mode, these devices are functionally equivalent to the 'F652 and 'ABT652 octal Bus Transceivers and Registers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal Bus Transceivers and Registers
Data flow in each direction is controlled by Clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated Registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and inputs. Since the input is active low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 shows the four fundamental bus-management functions that CAN be performed with the 'ABT8652.
In the test mode, the normal operation of the SCOPETM Bus Transceivers and Registers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test Clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP Interface
The SN54ABT8652 is characterized for operation over the full military temperature range of -55?C to 125?C. The SN74ABT8652 is characterized for operation from -40?C to 85?C.
By Texas Instruments
Part Manufacturer Description Datasheet Samples
SN74ABT8652DWR Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, PLASTIC, SOIC-28, Bus Driver/Transceiver
SN74ABT8652DW Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SOIC -40 to 85
SN74ABT8652DLG4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SSOP -40 to 85
SN74ABT8652DWG4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SOIC -40 to 85
SN74ABT8652DLRG4 Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SSOP-28, Bus Driver/Transceiver
SN74ABT8652DLR Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, SSOP-28, Bus Driver/Transceiver
SN74ABT8652DWRE4 Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, PLASTIC, SOIC-28, Bus Driver/Transceiver
SN74ABT8652DWRG4 Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SOIC-28, Bus Driver/Transceiver
SN74ABT8652DL Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SSOP -40 to 85
SN74ABT8652DWE4 Texas Instruments Scan Test Devices With Octal Bus Transceivers And Registers 28-SOIC -40 to 85
SN74ABT8652 's PackagesSN74ABT8652 's pdf datasheet
SN74ABT8652DL SSOP
SN74ABT8652DLG4 SSOP
SN74ABT8652DLR SSOP
SN74ABT8652DLRG4 SSOP
SN74ABT8652DW SOIC
SN74ABT8652DWE4 SOIC
SN74ABT8652DWG4 SOIC
SN74ABT8652DWR SOIC
SN74ABT8652DWRE4 SOIC
SN74ABT8652DWRG4 SOIC

SN74ABT8652 pdf datasheet download


SN74ABT8652 Pinout, Pinouts
SN74ABT8652 pinout,Pin out
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