Scan Test Devices With Octal Registered Bus Transceivers

The ABT8952 scan test devices with octal registered Bus Transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface
In the normal mode, these devices are functionally equivalent to the 'BCT2952 and 'ABT2952 octal registered Bus Transceivers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered Bus Transceivers
Data flow in each direction is controlled by Clock (CLKAB and CLKBA), clock-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, A-bus data is stored in the associated Registers on the low-to-high transition of CLKAB, provided that is low. Otherwise, if is high or CLKAB remains at a static low or high level, the Register contents are not changed. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B, but uses CLKBA, , and .
In the test mode, the normal operation of the SCOPETM registered Bus Transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test Clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP Interface
The SN54ABT8952 is characterized for operation over the full military temperature range of -55?C to 125?C. The SN74ABT8952 is characterized for operation from -40?C to 85?C.
By Texas Instruments
Part Manufacturer Description Datasheet Samples
SN74ABT8952DLRG4 Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SSOP-28, Bus Driver/Transceiver
SN74ABT8952DLR Texas Instruments IC ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, SSOP-28, Bus Driver/Transceiver
SN74ABT8952DL Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SSOP -40 to 85
SN74ABT8952DW Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SOIC -40 to 85
SN74ABT8952DWR Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SOIC -40 to 85
SN74ABT8952DWRG4 Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SOIC -40 to 85
SN74ABT8952DWG4 Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SOIC -40 to 85
SN74ABT8952DWRE4 Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SOIC -40 to 85
SN74ABT8952DLG4 Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SSOP -40 to 85
SN74ABT8952DWE4 Texas Instruments Scan Test Devices With Octal Registered Bus Transceivers 28-SOIC -40 to 85
SN74ABT8952 's PackagesSN74ABT8952 's pdf datasheet
SN74ABT8952DL SSOP
SN74ABT8952DLG4 SSOP
SN74ABT8952DLR SSOP
SN74ABT8952DLRG4 SSOP
SN74ABT8952DW SOIC
SN74ABT8952DWE4 SOIC
SN74ABT8952DWC27G4 SOIC
SN74ABT8952DWR SOIC
SN74ABT8952DWRE4 SOIC
SN74ABT8952DWRG4 SOIC

SN74ABT8952 pdf datasheet download


SN74ABT8952 Pinout, Pinouts
SN74ABT8952 pinout,Pin out
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