IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers

The BCT8244A scan test devices with octal Buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface
In the normal mode, these devices are functionally equivalent to the 'F244 and 'BCT244 octal Buffers The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal Buffers
In the test mode, the normal operation of the SCOPETM octal Buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry CAN perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990.
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test Clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP Interface
The SN54BCT8244A is characterized for operation over the full military temperature range of -55?C to 125?C. The SN74BCT8244A is characterized for operation from 0?C to 70?C.
By Texas Instruments
Part Manufacturer Description Datasheet Samples
SN74BCT8244ADWR Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
SN74BCT8244ANTE4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70
SN74BCT8244ANT Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70
SN74BCT8244ADWRG4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
SN74BCT8244ADWG4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
SN74BCT8244ADW Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
SN74BCT8244ADWRE4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
SN74BCT8244ADWE4 Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70
SN74BCT8244A 's PackagesSN74BCT8244A 's pdf datasheet
SN74BCT8244ADW SOIC
SN74BCT8244ADWE4 SOIC
SN74BCT8244ADWG4 SOIC
SN74BCT8244ADWR SOIC
SN74BCT8244ADWRE4 SOIC
SN74BCT8244ADWRG4 SOIC
SN74BCT8244ANT PDIP
SN74BCT8244ANTE4 PDIP

SN74BCT8244A pdf datasheet download


SN74BCT8244A Pinout, Pinouts
SN74BCT8244A pinout,Pin out
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