3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

The SN74LVT18502 and SN74LVT182502 scan test devices with 18-bit universal Bus Transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL Interface to a 5-V system environment. In the normal mode, these devices are 18-bit universal Bus Transceivers that combine D-type Latches and D-type Flip-Flops to allow data flow in transparent, latched, or clocked modes. They CAN be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry CAN be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal Bus Transceivers By Texas Instruments
Part Manufacturer Description Datasheet Samples
SN74LVT18502PM Texas Instruments 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85
SN74LVT18502PMLE Texas Instruments LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74LVT18502 's PackagesSN74LVT18502 's pdf datasheet
SN74LVT182502PM LQFP
SN74LVT18502PM LQFP




SN74LVT18502 Pinout, Pinouts
SN74LVT18502 pinout,Pin out
This is one package pinout of SN74LVT18502,If you need more pinouts please download SN74LVT18502's pdf datasheet.

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