3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

The LVTH18514 and LVTH182514 scan test devices with 20-bit universal Bus Transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) Interface Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL Interface to a 5-V system environment. By Texas Instruments
SN74LVTH182514 's PackagesSN74LVTH182514 's pdf datasheet
SN54LVTH18514
SN54LVTH182514




SN74LVTH182514 Pinout, Pinouts
SN74LVTH182514 pinout,Pin out
This is one package pinout of SN74LVTH182514,If you need more pinouts please download SN74LVTH182514's pdf datasheet.

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